High-volume products use compression to manage test costs while adding all the tests needed for advanced nanometer fabrication processes. The most advanced compression technologies use simple logic ...
The trend in semiconductors leads to more IC test data volume, longer test times, and higher test costs. Embedded deterministic test (EDT) has continued to deliver more compression, which has been ...
Next Gen Scan Compression Technique to overcome Test challenges at Lower Technology Nodes (Part - I)
We live in an era where the demand for portable and wearable devices have been increasing multifold. Products based on applications like IoT (Internet of Things), Artificial Intelligence, Virtual ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback