Two types of thin films illustrated in Figure 1 were d eposited by Ti-Zn alternative sputtering using a tripole magnetron sputtering apparatus. Figure 2 shows XRD patterns of single and triple layer ...

This in turn has required a change in analytical techniques to include X-Ray Diffraction (XRD), which is required to accurately identify the relative amounts of rutile and anatase, given that both are ...

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