Parallel test is used for nearly every device produced by fabs and OSATs, but it can reduce yield and increase the cost of test boards and operations. This is a well-understood tradeoff for ensuring ...
November 11, 2013. Multitest, a designer and manufacturer of final test handlers, contactors, and load boards used by integrated device manufacturers (IDMs) and final-test subcontractors, announced ...
A new paradigm for semiconductor manufacturing test is coming. Unfortunately, it’s not yet completely defined, and most manufacturers still retain the traditional split between so-called front-end and ...
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