A new technical paper titled “Electron Microscopy-based Automatic Defect Inspection for Semiconductor Manufacturing: A Systematic Review” was published by researchers at KU Leuven and imec. “In this ...
Figure 2: Schematic representation of TMD growth progress over time using the Hypotaxy method. Figure 3: (From top to bottom) Schematic representation of TMD growth progress over time, transmission ...
Chiral metasurfaces can strongly twist the polarization of light, but how this process unfolds in space and time has been unclear. Scientists in China have now used ultrafast electron microscopy and ...
Scanning transmission electron microscopy, or STEM, is a powerful imaging technique that enables researchers to study a material’s morphology, composition, and bonding behavior at the angstrom scale.
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