A comparison of experimental annular dark field (ADF)-scanning transmission electron microscopy (STEM) and electron ptychography in uncorrected and aberration-corrected electron microscopes. In the ...

Researchers say the innovation, known as SmartEM, will speed scanning sevenfold and open the field of connectomics to a ...

This instrument is an advanced and digitally dedicated transmission electron microscope operating at 200kV with a field-emission gun. It is capable of an ultimate point-to-point resolution of 0.19 nm, ...

Support grids are a key part of electron microscopy measurements; the choice of the grid can directly influence the quality and accuracy of the final image. This is particularly true for transmission ...

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Traditional electron microscopy techniques include scanning electron microscopy (SEM) and transmission electron microscopy (TEM), where electrons that interact with the sample are imaged. 4 The ...

This year, the electron microscopy community marks the 25 th anniversary of the release of the first aberration-corrected transmission electron microscope. To celebrate the occasion, this article ...