Measures total hemispherical reflectance, 3 to >35 micrometers, and performs integrated total hemispheric reflectance measurement, 250 nm to 2500 nm. The TESA 2000, by virtue of an advanced optical ...
Gamma Scientific has announced the release of their new Automated Reflectometer Systems for measuring isolated first surface reflectance of thin film coatings on display glass. A proprietary design ...
• Leaf optical properties impact leaf energy balance and thus leaf temperature. The effect of leaf development on mid-infrared (MIR) reflectance, and hence thermal emissivity, has not been ...
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