Frenchtown, N.J. — Aries Electronics has introduced a new center probe RF test socket designed specifically for use with Delta handlers. The new test sockets incorporate built-in, replaceable, ...
Test is a dirty business. It can contaminate a unit or wafer, or the test hardware, which in turn can cause problems in the field. While this has not gone unnoticed, particularly as costs rise due to ...
Testing multiple devices at the same time is not providing the equivalent reduction in overall test time due to a combination of test execution issues, the complexity of the devices being tested, and ...
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