Detecting macro-defects early in the wafer processing flow is vital for yield and process improvement, and it is driving innovations in both inspection techniques and wafer test map analysis. At the ...

Assembly houses are fine-tuning their methodologies and processes for automotive ICs, optimizing everything from inspection and metrology to data management in order to prevent escapes and reduce the ...

Google today announced the launch of Visual Inspection AI, a new Google Cloud Platform (GCP) solution designed to help manufacturers, consumer packaged goods companies, and other businesses reduce ...

Achieved early detection of cause of defects in raw materials through AI, becoming "first to overcome this challenge in the industry" Applied to high-value semiconductor substrates, analyzing raw ...

Amazon today announced the general availability of Amazon Lookout for Vision, a cloud service that analyzes images using computer vision to spot product or process defects and anomalies in ...

In the world of plastic injection molding, scrap can cripple a company’s ability to turn a profit. Part defects can be caused by a multitude of molding factors, but speed and time settings associated ...