TOKYO, Feb. 12, 2025 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) today announced the T5801 Ultra-High-Speed DRAM Test System. The cutting-edge ...
NORTH READING, Mass.--(BUSINESS WIRE)--Teradyne, Inc. (NASDAQ: TER), a leading provider of automated test equipment and advanced robotics, is proud to announce the launch of the Magnum 7H, a ...
High-bandwidth memory (HBM) is an important part of AI processors, handling massive data processing and computations. In response, Teradyne, Inc. has launched the Magnum 7H, a next-generation memory ...
Advantest has introduced the M5241 Memory Handler, its next-generation handler developed to meet the performance, automation ...
Advantest’s booth #634 will be in Hall B of the convention center. The company will feature its end-to-end memory test solutions for testing next-generation memory chips, such as high-bandwidth memory ...
Left-shifting DFT, scalable tests from manufacturing to the field, enabling system-level tests for in-field debug.
The rapid advancement of artificial intelligence (AI) is driving unprecedented demand for high-performance memory solutions. AI-driven applications are fueling significant year-over-year growth in ...
New platform delivers high-precision temperature control, maximized uptime, and enhanced maintainability to facilitate advanced memory test M5241 Memory Handler Next-generation M5241 Memory Handler to ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback